INVESTIGATION OF NANO STRUCTURAL PROPERTIES OF AG/SIO2

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BAHARI ALI; FADAEI S.M.

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Journal: IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING Year:2010 | Volume:- | Issue:8 Page(s): 41-47

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Title

INVESTIGATION OF NANO STRUCTURAL PROPERTIES OF AG/SIO2

Author(s)

BAHARI ALI | FADAEI S.M. | Issue Writer Certificate

Keywords

THIN FILMQ3

SILICON OXIDEQ4

SILVER FILMQ4

SYNCHROTRON RADIATIONQ4

Abstract

Field effect transistor is of importance in the integrated circuit. The metal electrode is on a silicon dioxide layer and is grown on a silicon substrate. We used silver as the electrode. The structural properties of a single silver layer on top of the SILICON OXIDE film has been studied using SYNCHROTRON RADIATION, sensitive to changes in a chemical environment, permits high resolution photoelectron spectroscopy of nano thickness SILVER FILM on top of oxide. The local variations of the Ag /Sio2/si demonstrated a good uniformity of coverage oxide film and the weaker electrical field across the thinner oxide film (< 2 nm) respect to thicker oxide film.

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APA: Copy

BAHARI, ALI, & FADAEI, S.M.. (2010). INVESTIGATION OF NANO STRUCTURAL PROPERTIES OF AG/SIO2. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, -(8), 41-47. SID. https://sid.ir/paper/121007/en

Vancouver: Copy

BAHARI ALI, FADAEI S.M.. INVESTIGATION OF NANO STRUCTURAL PROPERTIES OF AG/SIO2. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING[Internet]. 2010;-(8):41-47. Available from: https://sid.ir/paper/121007/en

IEEE: Copy

ALI BAHARI, and S.M. FADAEI, “INVESTIGATION OF NANO STRUCTURAL PROPERTIES OF AG/SIO2,” IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, vol. -, no. 8, pp. 41–47, 2010, [Online]. Available: https://sid.ir/paper/121007/en

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