Recent developments in dynamic transmission electron microscopy

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

Shobeikeh Sanaz

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: IRANIAN JOURNAL OF LABORATORY KNOWLEDGE Year:2019 | Volume:7 | Issue:3 (27) Page(s): 20-32

Download Full-Text

Persian Verion

View:

614

Download:

Cites:

Information Journal Paper

Title

Recent developments in dynamic transmission electron microscopy

Author(s)

Shobeikeh Sanaz | Issue Writer Certificate

Keywords

Dynamic TEM

Dark-field imaging

In-situ microscopy

Liquid stages

Gas stages

Abstract

One of the current major driving forces behind instrument development in transmission electron microscopy (TEM) is the ability to observe materials processes as they occur in situ within the microscope. For many processes, such as nucleation and growth, phase transformations and mechanical response under extreme conditions, the beam current in even the most advanced field emission TEM is insufficient to acquire images with the temporal resolution (∼ 1 μ s to 1 ns) needed to observe the fundamental interactions taking place. The dynamic transmission electron microscope (DTEM) avoids this problem by using a short pulse laser to create an electron pulse of the required duration through photoemission which contains enough electrons to form a complete high resolution image. The current state-of-the-art in high time resolution electron microscopy in this paper describes the development of the electron optics and detection schemes necessary to fully utilize these electron pulses for materials science. In addition, developments for future instrumentation and the experiments that are expected to be realized shortly will also be discussed [53].

Cites

No record.

References

No record.

Cite

APA: Copy

Shobeikeh, Sanaz. (2019). Recent developments in dynamic transmission electron microscopy. IRANIAN JOURNAL OF LABORATORY KNOWLEDGE, 7(3 (27) ), 20-32. SID. https://sid.ir/paper/269047/en

Vancouver: Copy

Shobeikeh Sanaz. Recent developments in dynamic transmission electron microscopy. IRANIAN JOURNAL OF LABORATORY KNOWLEDGE[Internet]. 2019;7(3 (27) ):20-32. Available from: https://sid.ir/paper/269047/en

IEEE: Copy

Sanaz Shobeikeh, “Recent developments in dynamic transmission electron microscopy,” IRANIAN JOURNAL OF LABORATORY KNOWLEDGE, vol. 7, no. 3 (27) , pp. 20–32, 2019, [Online]. Available: https://sid.ir/paper/269047/en

Related Journal Papers