FAST DEFECT DETECTION IN CLOTHS WITH B-SPLINES

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ZENG P.; HIRATA T.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: IRANIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING (IJECE) Year:2002 | Volume:1 | Issue:1 Page(s): 29-34

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Information Journal Paper

Title

FAST DEFECT DETECTION IN CLOTHS WITH B-SPLINES

Author(s)

ZENG P. | HIRATA T. | Issue Writer Certificate

Keywords

B-SPLINE TRANSFORM

COMPUTER VISION

FABRIC INSPECTION

EDGE DETECTION

DEFECT DETECTION

Abstract

In this paper, an algorithm for fast DEFECT DETECTION in cloths based on fast B-SPLINE TRANSFORM is proposed. The algorithm can be applied to analyzing images at any integer scale for defect information. It can also be extended to a parallel algorithm that decomposes images at all desired scales simultaneously. A threshold parameter δth is used to adjust the DEFECT DETECTION reliability. A desired compromise between fault recognition and continuity of edge pixels can be reached by adjusting the value of δth properly.

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APA: Copy

ZENG, P., & HIRATA, T.. (2002). FAST DEFECT DETECTION IN CLOTHS WITH B-SPLINES. IRANIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING (IJECE), 1(1), 29-34. SID. https://sid.ir/paper/283362/en

Vancouver: Copy

ZENG P., HIRATA T.. FAST DEFECT DETECTION IN CLOTHS WITH B-SPLINES. IRANIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING (IJECE)[Internet]. 2002;1(1):29-34. Available from: https://sid.ir/paper/283362/en

IEEE: Copy

P. ZENG, and T. HIRATA, “FAST DEFECT DETECTION IN CLOTHS WITH B-SPLINES,” IRANIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING (IJECE), vol. 1, no. 1, pp. 29–34, 2002, [Online]. Available: https://sid.ir/paper/283362/en

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