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Information Journal Paper

Title

A HIGH-RESOLUTION MACHINE VISION SYSTEM FOR STRAIN ANALYSIS

Pages

  61-67

Abstract

 A high-resolution MACHINE VISION SYSTEM is presented for STRAIN ANALYSIS at high temperatures. The system uses a frame grabber with a spatial resolution of 1300x1030 and 10-bit gray-level. The main merits of the proposed system are: (1) it is a whole-field measuring technique; (2) it is non-contact technique and (3) it is easy to set up and apply. It is shown that the proposed system can measure strains at high temperatures with an error less than 2%.

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  • Cite

    APA: Copy

    HOSSEINI, K., & LU, Z.. (2003). A HIGH-RESOLUTION MACHINE VISION SYSTEM FOR STRAIN ANALYSIS. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE (ENGLISH), 14(4), 61-67. SID. https://sid.ir/paper/530472/en

    Vancouver: Copy

    HOSSEINI K., LU Z.. A HIGH-RESOLUTION MACHINE VISION SYSTEM FOR STRAIN ANALYSIS. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE (ENGLISH)[Internet]. 2003;14(4):61-67. Available from: https://sid.ir/paper/530472/en

    IEEE: Copy

    K. HOSSEINI, and Z. LU, “A HIGH-RESOLUTION MACHINE VISION SYSTEM FOR STRAIN ANALYSIS,” INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE (ENGLISH), vol. 14, no. 4, pp. 61–67, 2003, [Online]. Available: https://sid.ir/paper/530472/en

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    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
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