Information Journal Paper
APA:
CopyPING TSUNG, W.U., & SHWU JANE, SHIEH. (2007). VALUE-AT-RISK ANALYSIS FOR LONG-TERM INTEREST RATE FUTURES:FAT-TAIL AND LONG MEMORY IN RETURN INNOVATIONS. JOURNAL OF EMPIRICAL FINANCE, 14(2), 248-259. SID. https://sid.ir/paper/560672/en
Vancouver:
CopyPING TSUNG W.U., SHWU JANE SHIEH. VALUE-AT-RISK ANALYSIS FOR LONG-TERM INTEREST RATE FUTURES:FAT-TAIL AND LONG MEMORY IN RETURN INNOVATIONS. JOURNAL OF EMPIRICAL FINANCE[Internet]. 2007;14(2):248-259. Available from: https://sid.ir/paper/560672/en
IEEE:
CopyW.U. PING TSUNG, and SHIEH SHWU JANE, “VALUE-AT-RISK ANALYSIS FOR LONG-TERM INTEREST RATE FUTURES:FAT-TAIL AND LONG MEMORY IN RETURN INNOVATIONS,” JOURNAL OF EMPIRICAL FINANCE, vol. 14, no. 2, pp. 248–259, 2007, [Online]. Available: https://sid.ir/paper/560672/en