USING THE COMPETING VALUES FRAMEWORK TO IDENTIFY THE IDEAL CULTURE PROFILE FOR TQM: A UK PERSPECTIVE

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AL KHALIFA K.; ASPINWALL E.

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Journal Paper

Paper Information

Journal: JOURNAL OF MANUFACTURING TECHNOLOGY MANAGEMENT Year:2000 | Volume:2 | Issue:1-7 Page(s): 1024-1040

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Information Journal Paper

Title

USING THE COMPETING VALUES FRAMEWORK TO IDENTIFY THE IDEAL CULTURE PROFILE FOR TQM: A UK PERSPECTIVE

Author(s)

AL KHALIFA K. | ASPINWALL E. | Issue Writer Certificate

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Abstract

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A STUDY OF THE RELATIONSHIP BETWEEN ORGANIZATIONAL CULTURE AND QUALITY IMPROVEMENT IN SELECTED HOSPITALS OF TEHRAN MEDICAL SCIENCES UNIVERSITIES

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APA: Copy

AL KHALIFA, K., & ASPINWALL, E.. (2000). USING THE COMPETING VALUES FRAMEWORK TO IDENTIFY THE IDEAL CULTURE PROFILE FOR TQM: A UK PERSPECTIVE. JOURNAL OF MANUFACTURING TECHNOLOGY MANAGEMENT, 2(1-7), 1024-1040. SID. https://sid.ir/paper/583171/en

Vancouver: Copy

AL KHALIFA K., ASPINWALL E.. USING THE COMPETING VALUES FRAMEWORK TO IDENTIFY THE IDEAL CULTURE PROFILE FOR TQM: A UK PERSPECTIVE. JOURNAL OF MANUFACTURING TECHNOLOGY MANAGEMENT[Internet]. 2000;2(1-7):1024-1040. Available from: https://sid.ir/paper/583171/en

IEEE: Copy

K. AL KHALIFA, and E. ASPINWALL, “USING THE COMPETING VALUES FRAMEWORK TO IDENTIFY THE IDEAL CULTURE PROFILE FOR TQM: A UK PERSPECTIVE,” JOURNAL OF MANUFACTURING TECHNOLOGY MANAGEMENT, vol. 2, no. 1-7, pp. 1024–1040, 2000, [Online]. Available: https://sid.ir/paper/583171/en

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