Information Journal Paper
APA:
CopyCARTAXO, A.V.T., & MORGADO, J.A.P.. (2000). ANALYSIS OF SEMICONDUCTOR LASER FREQUENCY NOISE TAKING INTO ACCOUNT MULTIPLE REFLECTIONS IN THE EXTERNAL CAVITY. IEE PROCESSING OF OPTOELECTRON, 147(-), 335-344. SID. https://sid.ir/paper/583947/en
Vancouver:
CopyCARTAXO A.V.T., MORGADO J.A.P.. ANALYSIS OF SEMICONDUCTOR LASER FREQUENCY NOISE TAKING INTO ACCOUNT MULTIPLE REFLECTIONS IN THE EXTERNAL CAVITY. IEE PROCESSING OF OPTOELECTRON[Internet]. 2000;147(-):335-344. Available from: https://sid.ir/paper/583947/en
IEEE:
CopyA.V.T. CARTAXO, and J.A.P. MORGADO, “ANALYSIS OF SEMICONDUCTOR LASER FREQUENCY NOISE TAKING INTO ACCOUNT MULTIPLE REFLECTIONS IN THE EXTERNAL CAVITY,” IEE PROCESSING OF OPTOELECTRON, vol. 147, no. -, pp. 335–344, 2000, [Online]. Available: https://sid.ir/paper/583947/en