A NEW METHOD FOR IMPROVING PATH DELAY FAULT COVERAGE

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

BATENI Z.; PEDRAM H.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION B- ENGINEERING Year:2006 | Volume:30 | Issue:B2 Page(s): 199-206

Download Full-Text

Persian Verion

View:

720

Download:

139

Cites:

Information Journal Paper

Title

A NEW METHOD FOR IMPROVING PATH DELAY FAULT COVERAGE

Author(s)

BATENI Z. | PEDRAM H. | Issue Writer Certificate

Keywords

SEQUENTIAL CIRCUITQ3

PATH DELAY FAULTQ3

FAULT COVERAGEQ3

Abstract

In the test of a circuit for faults it is very desirable to have the minimum paths that are to be tested for a complete circuit test. At first, the best test vectors are chosen and then these pairs of vectors are applied to the circuit. Each of these pair of vectors is able to detect a certain number of the faults and the PATH DELAY FAULT coverage for each and all of them may be calculated.Suitable choice of a path may result in the coverage of the whole circuit and increases detected faults. In this paper, a new method for choosing the minimum suitable paths is introduced. Decreasing the number of test paths causes an increase in the number of detectable faults by a certain number of test vector pairs, hence giving a better FAULT COVERAGE. In the presented method, a test path would be selected, if and only if, there exists at least one "two-piece" segment in that path which has not been tested before in the previously tested paths. If the chosen path has at least one "three-piece" (or "more-piece") segment the method will become more complicated. The method is applied to some ISCAS89 benchmarks circuits.

Cites

No record.

References

No record.

Cite

APA: Copy

BATENI, Z., & PEDRAM, H.. (2006). A NEW METHOD FOR IMPROVING PATH DELAY FAULT COVERAGE. IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION B- ENGINEERING, 30(B2), 199-206. SID. https://sid.ir/paper/62401/en

Vancouver: Copy

BATENI Z., PEDRAM H.. A NEW METHOD FOR IMPROVING PATH DELAY FAULT COVERAGE. IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION B- ENGINEERING[Internet]. 2006;30(B2):199-206. Available from: https://sid.ir/paper/62401/en

IEEE: Copy

Z. BATENI, and H. PEDRAM, “A NEW METHOD FOR IMPROVING PATH DELAY FAULT COVERAGE,” IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION B- ENGINEERING, vol. 30, no. B2, pp. 199–206, 2006, [Online]. Available: https://sid.ir/paper/62401/en

Related Journal Papers