Information Journal Paper
APA:
CopyMORTEZAALI, A., RAMEZANI SANI, S., & JOONI, F.J.. (2009). CORRELATION BETWEEN POROSITY OF POROUS SILICON AND OPTOELECTRONIC PROPERTIES. JOURNAL OF NON-OXIDE GLASSES, 1(-), 293-299. SID. https://sid.ir/paper/634082/en
Vancouver:
CopyMORTEZAALI A., RAMEZANI SANI S., JOONI F.J.. CORRELATION BETWEEN POROSITY OF POROUS SILICON AND OPTOELECTRONIC PROPERTIES. JOURNAL OF NON-OXIDE GLASSES[Internet]. 2009;1(-):293-299. Available from: https://sid.ir/paper/634082/en
IEEE:
CopyA. MORTEZAALI, S. RAMEZANI SANI, and F.J. JOONI, “CORRELATION BETWEEN POROSITY OF POROUS SILICON AND OPTOELECTRONIC PROPERTIES,” JOURNAL OF NON-OXIDE GLASSES, vol. 1, no. -, pp. 293–299, 2009, [Online]. Available: https://sid.ir/paper/634082/en