OPTICALLY DETECTED CYCLOTRON RESONANCE IN SEMICONDUCTORS USING FAR-INFRA RED LASERS

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KOUHIAN A.A.; PIDGEON C.

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Journal: JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY) Year:2003 | Volume:13 | Issue:47 Page(s): 993-1001

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Information Journal Paper

Title

OPTICALLY DETECTED CYCLOTRON RESONANCE IN SEMICONDUCTORS USING FAR-INFRA RED LASERS

Author(s)

KOUHIAN A.A. | PIDGEON C. | Issue Writer Certificate

Keywords

CYCLOTRON RESONANCEQ4

SEMICONDUCTOR SCATTERINGQ3

Abstract

ODCR has proven to be a highly sensitive technique for measuring the effective masses of semiconductors at microwave frequencies. The technique has shown many advantageous over conventi9nal types of CYCLOTRON RESONANCE measurements. The condition for well defined CYCLOTRON RESONANCE is ωcT>>1, where ωδ is the cyclotron frequency and is the (momentum) scattering time. The current work extends the technique to far infrared frequencies, exploiting the much greater ωcT values associated with the higher frequencies being used.

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APA: Copy

KOUHIAN, A.A., & PIDGEON, C.. (2003). OPTICALLY DETECTED CYCLOTRON RESONANCE IN SEMICONDUCTORS USING FAR-INFRA RED LASERS. JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY), 13(47), 993-1001. SID. https://sid.ir/paper/70290/en

Vancouver: Copy

KOUHIAN A.A., PIDGEON C.. OPTICALLY DETECTED CYCLOTRON RESONANCE IN SEMICONDUCTORS USING FAR-INFRA RED LASERS. JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY)[Internet]. 2003;13(47):993-1001. Available from: https://sid.ir/paper/70290/en

IEEE: Copy

A.A. KOUHIAN, and C. PIDGEON, “OPTICALLY DETECTED CYCLOTRON RESONANCE IN SEMICONDUCTORS USING FAR-INFRA RED LASERS,” JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY), vol. 13, no. 47, pp. 993–1001, 2003, [Online]. Available: https://sid.ir/paper/70290/en

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