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Information Journal Paper

Title

FABRICATING TI2ALN NANOLAMINATE BY DC MAGNETRON SPUTTERING

Pages

  23-28

Abstract

 We report on the fabrication of Ti2AlN in this article. THIN FILMS of the Mn+1AXn phase ( M: early transition metal; A: A-group element; X: C and/ or N; n=1-3) Ti2AlN were grown on Ti, Si and glass substrate from a Ti and Al compound target with an Ar/N2 gas mixture using DC MAGNETRON SPUTTERING system. X-ray diffraction and atomic force microscopy (AFM) were used to characterize the Ti2AlN (004) structure and morphology of the samples.

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  • Cite

    APA: Copy

    HANTEHZADEH, M.R., & GOUDARZI, S.. (2006). FABRICATING TI2ALN NANOLAMINATE BY DC MAGNETRON SPUTTERING. JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY), 16(59 (PHYSICS ISSUE)), 23-28. SID. https://sid.ir/paper/70326/en

    Vancouver: Copy

    HANTEHZADEH M.R., GOUDARZI S.. FABRICATING TI2ALN NANOLAMINATE BY DC MAGNETRON SPUTTERING. JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY)[Internet]. 2006;16(59 (PHYSICS ISSUE)):23-28. Available from: https://sid.ir/paper/70326/en

    IEEE: Copy

    M.R. HANTEHZADEH, and S. GOUDARZI, “FABRICATING TI2ALN NANOLAMINATE BY DC MAGNETRON SPUTTERING,” JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY), vol. 16, no. 59 (PHYSICS ISSUE), pp. 23–28, 2006, [Online]. Available: https://sid.ir/paper/70326/en

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