ZNO-BI2O3 STUDY OF THE ELECTRICAL PROPERTIES OF THIN LAYER

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ESHGHI GONBAKI S.; JALILIAN NOSRATI M.R.; TAEIDI F.

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Journal: JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY) Year:2010 | Volume:20 | Issue:75 (PHYSICS ISSUE) Page(s): 9-24

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Title

ZNO-BI2O3 STUDY OF THE ELECTRICAL PROPERTIES OF THIN LAYER

Author(s)

ESHGHI GONBAKI S. | JALILIAN NOSRATI M.R. | TAEIDI F. | Issue Writer Certificate

Keywords

ZNOQ3

BI2O3Q3

FOUR POINT PROBEQ3

NON OHMIC CONTACTQ3

SANDWICHQ3

STRUCTURE OF AL−ZNO−ALQ3

Abstract

Introduction: Viristors are seramical electrical species that primary work of them is limitation of temporary voltages in amount that was unsafe for system. oxide Viristors have symetric and non-linear I-V (voltage-current) characteristics.one of the most important component that used for visitor preparation is ZNO-Bi2O3. Although it is shown that intergranular material probably for due to existence potential barriers in grain boundaries, details of mechanisms is not known now.Aim: Study electrical properties of thin layer ZNO-Bi2O3 and SANDWICH structure of Al- ZNO -Al and measurment evaluation with 4point probe and 2point probe in vacuity cell.Materials and Methods: in this study ZNO-Bi2O3 and SANDWICH structure Al-ZNO-Al on basis of single grain boundary model were evaluated. Conductivity mechanisms with study properties of I-V characteristics evaluated in vacuum. For samples preparation, R-F sputtering for ZNO deposition and Vacuum evaporation method for Bi2O3 and Al films. Effect of vacuity and increasing of temperatue in I-V characteristic were evaluated.Results: In ZNO measuring with 4point probe for high amount resistance of ZNO, voltage and probe permanently changed and were not measurable. This shows that our contacts on tip of the probes were nonohmic but in measuring with 4point probes, touches must be ohmic and for this reasons and 4 point probe limitation this probe was no valuable and only trust to SANDWICH structure that measured in vacuum. From evaluation SANDWICH structures two paradox results earned. Separation of the connection Ag forincreasing temperature probably shows that I-V characterizes is not related to ZNO. SANDWICH structure can be shows electrical conductive from volume of sample. Measuring of the electrical conductive of ZNO-Bi2O3 in this research probably related to conduction from the surface of sample. Furthermore usage of the SANDWICH structures in papers lead to measuring of the electrical conductive from the volume of sample.with evaluation measuring, measuring with 4point probes for reason humidity and surface conductive, shows more electrical conductive in comparison in vacuum and vacuum and increasing of the sample temperature decrease conductivity.Conclusion: Measuring of the electrical conductive of ZNO-Bi2O3 two layers and SANDWICH structure Al-ZNO-Al shows that with attention to the FOUR POINT PROBE limitation, contacts must be ohmic and point contact of probes must be minimum resistance, but for easuring were not done in vaccum and it may be contacts were not ohmic, for this reason it is not measuring conditions, only measuing from SANDWICH structures is trustbles.

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APA: Copy

ESHGHI GONBAKI, S., JALILIAN NOSRATI, M.R., & TAEIDI, F.. (2010). ZNO-BI₂O₃ STUDY OF THE ELECTRICAL PROPERTIES OF THIN LAYER. JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY), 20(75 (PHYSICS ISSUE)), 9-24. SID. https://sid.ir/paper/70510/en

Vancouver: Copy

ESHGHI GONBAKI S., JALILIAN NOSRATI M.R., TAEIDI F.. ZNO-BI₂O₃ STUDY OF THE ELECTRICAL PROPERTIES OF THIN LAYER. JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY)[Internet]. 2010;20(75 (PHYSICS ISSUE)):9-24. Available from: https://sid.ir/paper/70510/en

IEEE: Copy

S. ESHGHI GONBAKI, M.R. JALILIAN NOSRATI, and F. TAEIDI, “ZNO-BI₂O₃ STUDY OF THE ELECTRICAL PROPERTIES OF THIN LAYER,” JOURNAL OF SCIENCES (ISLAMIC AZAD UNIVERSITY), vol. 20, no. 75 (PHYSICS ISSUE), pp. 9–24, 2010, [Online]. Available: https://sid.ir/paper/70510/en

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