مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

video

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

sound

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Persian Version

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

View:

158
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Download:

296
مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Cites:

Information Journal Paper

Title

Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry

Pages

  115-125

Abstract

 The X-ray fluorescence spectrometry and the MA. BM. 006 reference spectrophotometric methods were used to determine the content of SiO2 (%) in bauxites from different deposits. The treatment of samples prior to the analysis involved the following steps: annealing, melting using the borax method, and the formation of beads. Certified reference bauxite samples were used for the calibration curve. The calibration curve was produced with the correlation coefficient of r =0. 9999 and the standard error of S = 0. 0246. The average residual value between the content of SiO2 determined using the XRF method, and the reference method was 0. 045, with a standard deviation of 0. 068. The XRF method was statistically verified by the F-and t-tests (using the standard sample and the reference method). The values obtained in the tests show that the XRF method yields accurate results and that there are no standard errors.

Multimedia

  • No record.
  • Cites

  • No record.
  • References

  • No record.
  • Cite

    APA: Copy

    Blagojevic, Dragana, Lazic, Dragica, Keselj, Dragana, skundric, Branko, Dugic, Pero, & Ostojic, Gordana. (2019). Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry. IRANIAN JOURNAL OF CHEMISTRY AND CHEMICAL ENGINEERING (IJCCE), 38(4), 115-125. SID. https://sid.ir/paper/758908/en

    Vancouver: Copy

    Blagojevic Dragana, Lazic Dragica, Keselj Dragana, skundric Branko, Dugic Pero, Ostojic Gordana. Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry. IRANIAN JOURNAL OF CHEMISTRY AND CHEMICAL ENGINEERING (IJCCE)[Internet]. 2019;38(4):115-125. Available from: https://sid.ir/paper/758908/en

    IEEE: Copy

    Dragana Blagojevic, Dragica Lazic, Dragana Keselj, Branko skundric, Pero Dugic, and Gordana Ostojic, “Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry,” IRANIAN JOURNAL OF CHEMISTRY AND CHEMICAL ENGINEERING (IJCCE), vol. 38, no. 4, pp. 115–125, 2019, [Online]. Available: https://sid.ir/paper/758908/en

    Related Journal Papers

  • No record.
  • Related Seminar Papers

  • No record.
  • Related Plans

  • No record.
  • Recommended Workshops






    Move to top
    email sharing button
    telegram sharing button
    whatsapp sharing button
    linkedin sharing button
    twitter sharing button
    email sharing button
    email sharing button
    sharethis sharing button