ION BEAM ANALYSIS: A POWERFUL TOOL FOR THIN FILM AND MATERIAL CHARACTERIZATION

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AGHA ALIGOL D.; BAGHIZADEH A.; LAMEHI RACHTI M.; OLIAYI P.; SHOKOUHI F.

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Seminar Paper

Paper Information

Seminar: NATIONAL VACUUM CONFERENCE IRAN
Year:2008 | Issue:3

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Title

ION BEAM ANALYSIS: A POWERFUL TOOL FOR THIN FILM AND MATERIAL CHARACTERIZATION

Author(s)

AGHA ALIGOL D. | BAGHIZADEH A. | LAMEHI RACHTI M. | OLIAYI P. | SHOKOUHI F.

Keywords

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Abstract

ION BEAM ANALYSIS IS A POWERFUL TOOL FOR THE ANALYSIS AND CHARACTERIZATION OF MATERIALS. SOME OF THESE METHODS SUCH AS PIXE ARE ROUTINELY USED SINCE 1975 IN TEHRAN VAN DE GRAFF LABORATORY. OTHER METHODS SUCH AS MICRO-PIXE, RBS-CHANNELING AND ERD BECAME OPERATIONAL SINCE 2001. IN THIS LECTURE, AFTER A SHORT DESCRIPTION OF THESE METHODS, SOME APPLICATIONS OF THESE ANALYTICAL METHODS IN DIFFERENT FIELDS OF RESEARCH WILL BE PRESENTED.

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APA: Copy

AGHA ALIGOL, D., BAGHIZADEH, A., LAMEHI RACHTI, M., OLIAYI, P., & SHOKOUHI, F.. (2008). ION BEAM ANALYSIS: A POWERFUL TOOL FOR THIN FILM AND MATERIAL CHARACTERIZATION. NATIONAL VACUUM CONFERENCE IRAN. SID. https://sid.ir/paper/905399/en

Vancouver: Copy

AGHA ALIGOL D., BAGHIZADEH A., LAMEHI RACHTI M., OLIAYI P., SHOKOUHI F.. ION BEAM ANALYSIS: A POWERFUL TOOL FOR THIN FILM AND MATERIAL CHARACTERIZATION. 2008. Available from: https://sid.ir/paper/905399/en

IEEE: Copy

D. AGHA ALIGOL, A. BAGHIZADEH, M. LAMEHI RACHTI, P. OLIAYI, and F. SHOKOUHI, “ION BEAM ANALYSIS: A POWERFUL TOOL FOR THIN FILM AND MATERIAL CHARACTERIZATION,” presented at the NATIONAL VACUUM CONFERENCE IRAN. 2008, [Online]. Available: https://sid.ir/paper/905399/en

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