A PARTIALLY ACCELERATED LIFE TEST PLANNING WITH COMPETING RISKS AND LINEAR DEGRADATION PATH UNDER TAMPERED FAILURE RATE MODEL

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HAGHIGHI F.

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Seminar Paper

Paper Information

Seminar: SEMINAR ON RELIABILITY THEORY AND ITS APPLICATIONS
Year:2016 | Issue:2

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Title

A PARTIALLY ACCELERATED LIFE TEST PLANNING WITH COMPETING RISKS AND LINEAR DEGRADATION PATH UNDER TAMPERED FAILURE RATE MODEL

Author(s)

HAGHIGHI F. | Issue Writer Certificate

Keywords

ACCELERATED LIFE TESTING

COMPETING RISKS

DEGRADATION PATH

INTENSITYFUNCTION

TEMPERED FAILURE RATE MODEL

Abstract

IN THIS WORK, WE PROPOSED A PARTIALLY ACCELERATED LIFE TEST PLANNING IN THE PRESENCEOF COMPETING RISKS FOR THE PRODUCTS WITH LINEAR DEGRADATION PATH. THE COMPETINGRISKS INTENSITY WAS CONSIDERED TO BE ONLY DEPENDED ON THE DEGRADATION VALUE AND BELONG TO A PARAMETRIC FAMILY. IN THE PROPOSED PLAN, NO ASSUMPTIONS ARE MADE ABOUTFAILURE TIMES DISTRIBUTION AND A TAMPERED FAILURE RATE MODEL IS HOLD. THE MAXIMUMLIKELIHOOD ESTIMATION OF COMPETING RISKS INTENSITY PARAMETERS AS WELL AS THE OBSERVEDFISHER INFORMATION MATRIX ARE DERIVED. A SIMULATION STUDY IS CONDUCTED TO EVALUATETHE PERFORMANCE OF THE METHODS AND THE APPLICABILITY OF THE PROPOSED PLAN IS SHOWNBY USING A REAL DATA SET.

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APA: Copy

HAGHIGHI, F.. (2016). A PARTIALLY ACCELERATED LIFE TEST PLANNING WITH COMPETING RISKS AND LINEAR DEGRADATION PATH UNDER TAMPERED FAILURE RATE MODEL. SEMINAR ON RELIABILITY THEORY AND ITS APPLICATIONS. SID. https://sid.ir/paper/940421/en

Vancouver: Copy

HAGHIGHI F.. A PARTIALLY ACCELERATED LIFE TEST PLANNING WITH COMPETING RISKS AND LINEAR DEGRADATION PATH UNDER TAMPERED FAILURE RATE MODEL. 2016. Available from: https://sid.ir/paper/940421/en

IEEE: Copy

F. HAGHIGHI, “A PARTIALLY ACCELERATED LIFE TEST PLANNING WITH COMPETING RISKS AND LINEAR DEGRADATION PATH UNDER TAMPERED FAILURE RATE MODEL,” presented at the SEMINAR ON RELIABILITY THEORY AND ITS APPLICATIONS. 2016, [Online]. Available: https://sid.ir/paper/940421/en

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