مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Information Journal Paper

Title

RELATIONSHIPS BETWEEN ELECTRICAL CONDUCTIVITY OF IMBIBED SEEDS LEACHATE AND SUBSEQUENT SEEDLING GROWTH (VIABILIY AND VIGOUR) IN OMID WHEAT

Pages

  67-71

Abstract

 Electrical conductivity (EC) has been evaluated as a possible method for measuring viability and seedling vigour in WHEAT and other crops. A study was conducted using dormant, stock, naturally-aged (5 years) and artificially-aged (10 and 15 days) WHEAT seeds (Triticum aestivum cv. Omid) to evaluate the effect of different seed lots on ELECTRICAL CONDUCTIVITY. All seed lots were subjected to the following tests: standard germination; speed of germination; germination rate; time to reach 50% germination; ELECTRICAL CONDUCTIVITY and SEEDLING GROWTH rates. C.K.I), experimental design was used. Solute leakage from imbibed WHEAT seeds increased with treated or accelerated aging in a linear manner in the range over which vigour was depressed. Significant differences were observed among selected seed lots in most of the parameters of seed quality.

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  • Cite

    APA: Copy

    TAJBAKHSH, M.. (2000). RELATIONSHIPS BETWEEN ELECTRICAL CONDUCTIVITY OF IMBIBED SEEDS LEACHATE AND SUBSEQUENT SEEDLING GROWTH (VIABILIY AND VIGOUR) IN OMID WHEAT. JOURNAL OF AGRICULTURAL SCIENCE AND TECHNOLOGY (JAST), 2(1), 67-71. SID. https://sid.ir/paper/528538/en

    Vancouver: Copy

    TAJBAKHSH M.. RELATIONSHIPS BETWEEN ELECTRICAL CONDUCTIVITY OF IMBIBED SEEDS LEACHATE AND SUBSEQUENT SEEDLING GROWTH (VIABILIY AND VIGOUR) IN OMID WHEAT. JOURNAL OF AGRICULTURAL SCIENCE AND TECHNOLOGY (JAST)[Internet]. 2000;2(1):67-71. Available from: https://sid.ir/paper/528538/en

    IEEE: Copy

    M. TAJBAKHSH, “RELATIONSHIPS BETWEEN ELECTRICAL CONDUCTIVITY OF IMBIBED SEEDS LEACHATE AND SUBSEQUENT SEEDLING GROWTH (VIABILIY AND VIGOUR) IN OMID WHEAT,” JOURNAL OF AGRICULTURAL SCIENCE AND TECHNOLOGY (JAST), vol. 2, no. 1, pp. 67–71, 2000, [Online]. Available: https://sid.ir/paper/528538/en

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