X-ray diffraction measurements were performed on CoaPt1-a/Pd, Co/Pd, Co/Fe, and Co/W multilayer samples with different structures, such as CoaPt1-a alloy layer composition α, bilayer thickness, and number of bilayers. Multilayer samples were made by magnetron sputtering in a chamber with multi-parallel guns and a position controllable substrate. Co  Pt1-a/ alloy layers were deposited by cosputtering from Co and Pt targets mounted on guns tilted towards a common substrate. Compositions of Co and Pt in CoaPt1-a layer were varied by use of different sputtering power. The thicknesses of magnetic and non-magnetic layers in multilayered samples were also systematically changed to investigate the relationship between X-ray diffraction lines and crystalline structures of multilayered films. It was found that the position of the main diffraction peak from multilayered films was solely determined by the crystalline structures within bilayers rather than bilayer thickness. A model was introduced to calculate microstructural parameters such as the thickness of interfaces and compositions at interfaces.

The well-established Fresnel diffraction occurs as an opaque object partially obstructs the passage of a coherent beam of light. In this process, the amplitude of the optical wave experiences a discontinuous change that leads to peculiar bright and dark fringes near the ray optics border of the beam. The fringe pattern varies very slowly by distance from the object and away from the beam border the diffraction effect is negligible. These behaviors have limited the applications of the conventional Fresnel diffraction very severely. In this article, we introduce a new kind of Fresnel diffraction that occurs due to discontinuous change in phase or phase gradient, in a part of a coherent beam of light. The change splits the beam into two diffracting wavefronts with common border that interfere with each other. In this kind of diffraction, the fringes may appear in the central part of the beam and their locations and visibilities are very sensitive to the phase change. Therefore, the researchers have utilized the effect in the measurements of different physical quantities, with high accuracy, using modest equipment. In this article, we use the Fresnel diffraction from the semi-infinite opaque screen (knife-edge) as the building block to describe the introduced effect, diffraction from the phase steps, and discuss its different aspects. We simulate the implied diffraction patterns, investigate the patterns by experiments, elaborate on the unique features of the effect, and present some interesting applications.