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مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Issue Information

JOURNAL OF QUALITY TECHNOLOGY
Year:2006 | Volume:38 | Issue:3|Papers Count:1

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Year

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Title:

PHASE I ANALYSIS FOR MONITORING NONLINEAR PROFILES IN MANUFACTURING PROCESSES

Author(s):

DING Y. | ZENG L.

Journal:

JOURNAL OF QUALITY TECHNOLOGY

Issue Info:

Year:
2006
Volume:
38
Issue:
3
Pages:
199-216

Keywords:

Abstract:

Yearly Impact: مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Scientific Information Database

ISSN: 2588-4824

Journal Issue Information

JOURNAL OF QUALITY TECHNOLOGY Year:2006 | Volume:38 | Issue:3|Papers Count:1

JOURNAL OF QUALITY TECHNOLOGY
Year:2006 | Volume:38 | Issue:3|Papers Count:1