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مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Issue Information

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Year:2000 | Volume:33 | Issue:-|Papers Count:1

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Title:

ESTIMATING NANOPARTICLE SIZE FROM DIFFRACTION MEASUREMENTS

Author(s):

HALL B.D. | ZANCHET D.

Journal:

JOURNAL OF APPLIED CRYSTALLOGRAPHY

Issue Info:

Year:
2000
Volume:
33
Issue:
-
Pages:
1335-1341

Keywords:

Abstract:

Yearly Impact: مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Scientific Information Database

ISSN: 2588-4824

Journal Issue Information

JOURNAL OF APPLIED CRYSTALLOGRAPHY Year:2000 | Volume:33 | Issue:-|Papers Count:1

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Year:2000 | Volume:33 | Issue:-|Papers Count:1