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مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Issue Information

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Year:2005 | Volume:38 | Issue:-|Papers Count:1

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Title:

STRUCTURE OF NANOCRYSTALLINE MGFE2O4 FROM X-RAY DIFFRACTION. RIETVELD AND ATOMIC PAIR DISTRIBUTION FUNCTION ANALYSIS

Author(s):

GATESHKI M. | PETKOV V. | PRADHAN S.K.

Journal:

JOURNAL OF APPLIED CRYSTALLOGRAPHY

Issue Info:

Year:
2005
Volume:
38
Issue:
-
Pages:
772-779

Keywords:

Abstract:

Yearly Impact: مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Scientific Information Database

ISSN: 2588-4824

Journal Issue Information

JOURNAL OF APPLIED CRYSTALLOGRAPHY Year:2005 | Volume:38 | Issue:-|Papers Count:1

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Year:2005 | Volume:38 | Issue:-|Papers Count:1