IRANIAN JOURNAL OF LABORATORY KNOWLEDGE
Year:2020 | Volume:7 | Issue:4 (28) |Papers Count:5

Focused ion beam method (FIB), as one of the most powerful equipment, has a wide range application in the field of sample preparation, inspection and processing of equipment and machining in various fields such as semiconductors, metals, ceramics, polymers and life sciences. On the other hand, scanning electron microscopy is one of the strategic tools for advancing, analyzing and investigating researches especially in the nano fields. By studying morphology, topography, phase structures and chemical compounds, it can provide comprehensive information on the types of samples. Nowadays, in order to improve the efficiency, it is possible to investigation three-dimensional structures on the micro and nano scale, the possibility of studying on the site, the possibility of preparing sequential films and the ability to create images and control all the machining and preparation steps of the samples, a combination of these two techniques in the field of research, the technique of focused ion beam-scanning electron microscopy (FIB-SEM) has been presented. Due to the expansion of Nano scale research and industrial projects and the increasing need for advanced equipment to investigate and analyze them, the FIB-SEM technique, as one of the most fundamental diagnostic devices It is very important. Therefore, in this paper, the structure, function, and some of the applications of this technique are investigated.

Sulfur is one of the most abundant elements on the crust of Earth and also it is an essential element for animals and plants. In addition to playing a vital role in the living things, it has a very important use in industry as an ingredient in some chemicals, fertilizers, fungicides, pesticides, pharmaceuticals etc. There are limit values for sulfur content in many matrices, which originates why it is important to determine sulfur contents. This review aims to give an overview of historical development and importance of sulfur determination by high resolution continuum source atomic absorption spectrometry (HR CS AAS). We primarily focus on recent applications and their optimized parameters for determination of sulfur in many matrices. While application of sulfur determination by HR CS AAS is evaluated, some scientific properties of the sulfur determination by HR CS AAS are also presented.

With the advent of new technologies and great advances in various sciences, the science of chemistry has undergone many developments, especially in the field of chemistry. The advent of high-capacity devices for data generation has made it difficult to obtain information that was once considered a problem for chemists. But the question is how to extract the most necessary information from this wide range of data? Chemo metrics as a mathematical science and tool in chemistry can partly answer this question. This new science has helped to solve this problem by using mathematical methods and statistics.

This paper attempts to describe some of the important practical points in the preparation and imaging by transmission electron microscopy. These points include TEM room condition stabilization, ensuring device calibration, vacuum stabilization, preventing environmental pollution, sample washing, using techniques for drying with minimum structural damage, selecting the appropriate grid, utilizing liquid nitrogen, preventing sample warming and accuracy in determining magnification.