INVESTIGATION OF DIFFERENT ION EFFECTS ON THE ALUMINUM SAMPLES WITH A 2.5KJ MATER TYPE PLASMA FOCUS DEVICE

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SHAHBAZI Z.; SHAHRIARI M.; ABBASI DAVANI F.

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Journal: IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING Year:2012 | Volume:- | Issue:13 Page(s): 61-69

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Title

INVESTIGATION OF DIFFERENT ION EFFECTS ON THE ALUMINUM SAMPLES WITH A 2.5KJ MATER TYPE PLASMA FOCUS DEVICE

Author(s)

SHAHBAZI Z. | SHAHRIARI M. | ABBASI DAVANI F. | Issue Writer Certificate

Keywords

PLASMA FOCUSQ3

SURFACE MORPHOLOGYQ2

ION SPATIAL DISTRIBUTIONQ2

ENERGY DISPERSIVE X-RAYQ3

PENETRATION DEPTH OF IONSQ3

Abstract

The main purpose of this work is to investigate the effects of different ions produced in PLASMA FOCUS device (SBUPF1) with the specification of (8.6mF, 25 kV, 2.5kJ) on the Aluminum surface. Also the possibility of ion implantation with the use of this device has been investigated. Argon and Hydrogen+1%Krypton used as working gas. For determining optimum ion density, optimum pressure and operating voltage for Argon as operating gas have been obtained (0.45mbar and 22kV respectively). These parameters for Hydrogen+1%Krypton were 5mbar and 23kV respectively. Irradiated samples have been analyzed with SEM technique for morphological and surface study of samples. The EDX spectroscopy and the SRIM calculations have been done to determine the composition of samples and the penetration depth of the ions in the samples respectively. Melting and surface evaporation effects and generation of cracks were seen in these samples. The intensity of these effects for the samples put in different height from the anode top has been determined. Elemental analysis with EDX technique showed that copper ions penetrated into the samples due to sputtering from anode.

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طراحی و ساخت پیچه روگوفسکی مناسب برای اندازه گیری جریان تخلیه الکتریکی در لحظه وقوع تنگش در دستگاه پلاسمای کانونی sbumtpfl

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APA: Copy

SHAHBAZI, Z., SHAHRIARI, M., & ABBASI DAVANI, F.. (2012). INVESTIGATION OF DIFFERENT ION EFFECTS ON THE ALUMINUM SAMPLES WITH A 2.5KJ MATER TYPE PLASMA FOCUS DEVICE. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, -(13), 61-69. SID. https://sid.ir/paper/121112/en

Vancouver: Copy

SHAHBAZI Z., SHAHRIARI M., ABBASI DAVANI F.. INVESTIGATION OF DIFFERENT ION EFFECTS ON THE ALUMINUM SAMPLES WITH A 2.5KJ MATER TYPE PLASMA FOCUS DEVICE. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING[Internet]. 2012;-(13):61-69. Available from: https://sid.ir/paper/121112/en

IEEE: Copy

Z. SHAHBAZI, M. SHAHRIARI, and F. ABBASI DAVANI, “INVESTIGATION OF DIFFERENT ION EFFECTS ON THE ALUMINUM SAMPLES WITH A 2.5KJ MATER TYPE PLASMA FOCUS DEVICE,” IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, vol. -, no. 13, pp. 61–69, 2012, [Online]. Available: https://sid.ir/paper/121112/en

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