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Information Journal Paper

Title

EVALUATION OF PERFORMANCE OF CUMULATIVE DAMAGE MODELS IN SIMULATION OF CHIP SEPARATION

Pages

  1-13

Keywords

CUMULATIVE (PROGRESSIVE) DAMAGE CRITERIONQ2

Abstract

 In updated Lagrangian simulation of machining, CHIP SEPARATION from the work piece is done by deleting the elements of predefined critical values in front of the tool tip. In this paper, a systematic evaluation of three progressive damage models is carried out to identify the most suitable fracture criterion in simulation of CHIP SEPARATION. The three models considered are the Johnson–Cook (J-C), the modified Cockcroft–Latham (C-L), and the Wilkins models. In addition, a new algorithm is presented to calculate the coefficients of damage models in the range of very high strain, strain rate, temperature and pressure of machining processes and in presence of the combined effects of two different tensile and shear failure mechanisms. In this respect, the results obtained by few Arbitrary Lagrangian-Eulerian (ALE) simulations are used as sources to study the accumulation of damage. The steady state orthogonal cutting of AISI 1045 steel was considered to take benefit of evaluation of the models performances with available experimental data in "Assessment of Machining Models" (AMM) effort. Calibration of damage models in real condition of CHIP SEPARATION is the most important advantage of the new method. According to the obtained results, the Johnson–Cook damage model is the most capable CHIP SEPARATION criteria.

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    APA: Copy

    VAZIRI SERESHK, M.R., SALIMI, M., & MASHAYEKHI, M.. (2011). EVALUATION OF PERFORMANCE OF CUMULATIVE DAMAGE MODELS IN SIMULATION OF CHIP SEPARATION. JOURNAL OF COMPUTATIONAL METHODS IN ENGINEERING (ESTEGHLAL), 30(1), 1-13. SID. https://sid.ir/paper/173611/en

    Vancouver: Copy

    VAZIRI SERESHK M.R., SALIMI M., MASHAYEKHI M.. EVALUATION OF PERFORMANCE OF CUMULATIVE DAMAGE MODELS IN SIMULATION OF CHIP SEPARATION. JOURNAL OF COMPUTATIONAL METHODS IN ENGINEERING (ESTEGHLAL)[Internet]. 2011;30(1):1-13. Available from: https://sid.ir/paper/173611/en

    IEEE: Copy

    M.R. VAZIRI SERESHK, M. SALIMI, and M. MASHAYEKHI, “EVALUATION OF PERFORMANCE OF CUMULATIVE DAMAGE MODELS IN SIMULATION OF CHIP SEPARATION,” JOURNAL OF COMPUTATIONAL METHODS IN ENGINEERING (ESTEGHLAL), vol. 30, no. 1, pp. 1–13, 2011, [Online]. Available: https://sid.ir/paper/173611/en

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