Analysis of Transient Tip-Sample Interactions in High Speed Tapping Mode Atomic Force Microscopy with the Purpose of Damage Prevention

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

Fada H.; SOLEIMANI A.; SADEGHIAN H.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: Modares Mechanical Engineering Year:2019 | Volume:19 | Issue:8 Page(s): 1827-1836

Download Full-Text

Persian Verion

View:

346

Download:

Cites:

Information Journal Paper

Title

Analysis of Transient Tip-Sample Interactions in High Speed Tapping Mode Atomic Force Microscopy with the Purpose of Damage Prevention

Author(s)

Fada H. | SOLEIMANI A. | SADEGHIAN H. | Issue Writer Certificate

Keywords

High Speed AFMQ1

Tip-sample InteractionsQ1

Peak Repulsive ForceQ1

Transient SituationQ2

DamageQ2

Abstract

High speed atomic force microscopy (HS-AFM) is one of the widely used techniques in nanotechnology applications due to high resolution and the ability of 3D imaging. Despite its advantages and although it is known as a nondestructive technique, tip or sample Damage can occur if maximum repulsive force is higher than the failure stress of the sample or tip, as a result of Tip-sample Interactions. Several studies in understanding the Peak Repulsive Forces in tapping mode AFM have been carried out, but mostly in steady state situations. In Transient Situation when tip encounters a sudden steep upward step, the repulsive force can be much higher than that in the steady state situation and, consequently, Damage could happen. Therefore, if appropriate parameters’ values are not tuned, the tip-sample stress may exceed yield stress of the tip or the sample. This paper presents the comparison of maximum transient interaction forces in time periods of net attractive and repulsive forces and the effects of important scanning parameters on maximum transient stress of compliant samples with the elastic modulus in the range of 2GPa together with lateral resolution and scanning speed diagrams, using theoretical analysis as a novelty of this paper, so that selecting cantilever stiffness in the range of 0. 1-1N/m, free air amplitude 60-100nm, amplitude ratio 0. 8-0. 9, quality factor 50-100, tip radius 10-40 nm, and scanning speed 0. 1-0. 3mm/s relative to required lateral resolution indeed leads to safe high speed microscopy.

Cites

No record.

References

No record.

Cite

APA: Copy

Fada, H., SOLEIMANI, A., & SADEGHIAN, H.. (2019). Analysis of Transient Tip-Sample Interactions in High Speed Tapping Mode Atomic Force Microscopy with the Purpose of Damage Prevention. MODARES MECHANICAL ENGINEERING, 19(8 ), 1827-1836. SID. https://sid.ir/paper/178216/en

Vancouver: Copy

Fada H., SOLEIMANI A., SADEGHIAN H.. Analysis of Transient Tip-Sample Interactions in High Speed Tapping Mode Atomic Force Microscopy with the Purpose of Damage Prevention. MODARES MECHANICAL ENGINEERING[Internet]. 2019;19(8 ):1827-1836. Available from: https://sid.ir/paper/178216/en

IEEE: Copy

H. Fada, A. SOLEIMANI, and H. SADEGHIAN, “Analysis of Transient Tip-Sample Interactions in High Speed Tapping Mode Atomic Force Microscopy with the Purpose of Damage Prevention,” MODARES MECHANICAL ENGINEERING, vol. 19, no. 8 , pp. 1827–1836, 2019, [Online]. Available: https://sid.ir/paper/178216/en

Related Journal Papers