Ultrasonic thickness measurement of the internal insulation layer of metal surfaces by using signal processing schemes

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

Salehi-Firoozabadie P.; HONARVAR F.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: JOURNAL OF MECHANICAL ENGINEERING Year:2019 | Volume:49 | Issue:3 (88) Page(s): 193-202

Download Full-Text

Persian Verion

View:

435

Download:

Cites:

Information Journal Paper

Title

Ultrasonic thickness measurement of the internal insulation layer of metal surfaces by using signal processing schemes

Author(s)

Salehi-Firoozabadie P. | HONARVAR F. | Issue Writer Certificate

Keywords

Ultrasonic thickness gaging

EMD algorithm

wavelet transform

time delay

Abstract

There are many two-layerd components where the outer layer is a metal of high acoustic impedance and the inner (insulating) layer is a non-metal with low acoustic impedance. In most cases, it is impossible to directly access the inner layer for inspection or thickness gaging. The key problem in thickness gaging of the inner layer from the outer surface is that the backwall echo from the insulation cannot be identified in the very many backwall echoes coming back from the metal layer. In this paper, we use the signal processing techniques of wavelet transform and EMD algorithm to overcome this problem. To demonstrate the repeatability of these methods, three two-layered samples called A, B and C are prepared. The backwall echo of the insulation layer cannot be identified in any of these samples without further processing. The results indicate that both methods can facilitate the measurement of the insulation thickness, however, due to higher sensivity of the wavelet method, it is more suitable than the EMD algorithm.

Cites

No record.

References

No record.

Cite

APA: Copy

Salehi-Firoozabadie, P., & HONARVAR, F.. (2019). Ultrasonic thickness measurement of the internal insulation layer of metal surfaces by using signal processing schemes. JOURNAL OF MECHANICAL ENGINEERING, 49(3 (88) ), 193-202. SID. https://sid.ir/paper/270027/en

Vancouver: Copy

Salehi-Firoozabadie P., HONARVAR F.. Ultrasonic thickness measurement of the internal insulation layer of metal surfaces by using signal processing schemes. JOURNAL OF MECHANICAL ENGINEERING[Internet]. 2019;49(3 (88) ):193-202. Available from: https://sid.ir/paper/270027/en

IEEE: Copy

P. Salehi-Firoozabadie, and F. HONARVAR, “Ultrasonic thickness measurement of the internal insulation layer of metal surfaces by using signal processing schemes,” JOURNAL OF MECHANICAL ENGINEERING, vol. 49, no. 3 (88) , pp. 193–202, 2019, [Online]. Available: https://sid.ir/paper/270027/en

Related Journal Papers