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Information Journal Paper

Title

ERROR ANALYSIS, DESIGN AND MODELING OF AN IMPROVED HETERODYNE NANO-DISPLACEMENT INTERFEROMETER

Pages

  53-63

Abstract

 A new heterodyne NANO-DISPLACEMENT with error reduction is presented. The main errors affecting the displacement accuracy of the NANO-DISPLACEMENT measurement system including intermodulation distortion error, cross-talk error, CROSS-POLARIZATION error and phase detection error are calculated. In the designed system, a HE-NE LASER having three-longitudinal-mode is considered as the stabilized source. The free spectral range of the 35cm laser cavity is about 435-MHz at 632.8-nm wavelength, which a secondary beat frequency equal to 300-kHz is produced by combining the reference and measurement beams. The resolution of the displacement measurement resulting from intermodulation distortion, cross-talk and CROSS-POLARIZATION errors is limited to 18-pm. Also, the phase detection uncertainty causes an error of only 5.9-pm in the displacement measurement.Furthermore, FREQUENCY-PATH MODELs of two- and three-longitudinal-mode laser interferometers are modeled as the ac interference, ac reference, dc interference and optical power terms. A comparison study between two- and three-longitudinal-mode laser interferometers confirms that the performance of the designed system is considerably improved.

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  • Cite

    APA: Copy

    OULIAEI, S., & MOHAMMADNEZHAD, SH.. (2007). ERROR ANALYSIS, DESIGN AND MODELING OF AN IMPROVED HETERODYNE NANO-DISPLACEMENT INTERFEROMETER. IRANIAN JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING, 3(3-4), 53-63. SID. https://sid.ir/paper/299692/en

    Vancouver: Copy

    OULIAEI S., MOHAMMADNEZHAD SH.. ERROR ANALYSIS, DESIGN AND MODELING OF AN IMPROVED HETERODYNE NANO-DISPLACEMENT INTERFEROMETER. IRANIAN JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING[Internet]. 2007;3(3-4):53-63. Available from: https://sid.ir/paper/299692/en

    IEEE: Copy

    S. OULIAEI, and SH. MOHAMMADNEZHAD, “ERROR ANALYSIS, DESIGN AND MODELING OF AN IMPROVED HETERODYNE NANO-DISPLACEMENT INTERFEROMETER,” IRANIAN JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING, vol. 3, no. 3-4, pp. 53–63, 2007, [Online]. Available: https://sid.ir/paper/299692/en

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