Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum

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Azarvand Hassan Fard Bahare; Ebrahimi Ardei Khadijeh

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Paper Information

Journal: IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING Year:2019 | Volume:14 | Issue:38 Page(s): 43-51

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Information Journal Paper

Title

Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum

Author(s)

Azarvand Hassan Fard Bahare | Ebrahimi Ardei Khadijeh | Issue Writer Certificate

Keywords

thin filmsQ3

Al doped tin oxideQ1

X-ray diffractionQ2

optical transmissionQ1

resistivityQ1

Abstract

In this experimental work Al doped tin oxide thin films with different composition of 5 to 10 mass percent of Al and 95 to 90 mass percent of SnO2 were deposited on glass substrates by electron beam evaporation technique. Then effects Al and thickness on the electrical, optical and structural properties of thin films were investigated. Properties of thin films have been studied using X-ray diffraction, UV-Visible spectrophotometer and four probe methods. XRD photographs were prepared and show the polycrystalline structure formation and preferred orientation (110). Also by increasing films thickness, optical transmission and resistivity are decreased. So that in the case of the films with 7. 5 mass percent of Al, the average transmission decreases from 88. 5 % for film with a thickness of 250 nanometer to 82. 3 % for film with a thickness of 450 nanometer and resistivity reaches to its minimum value of 5. 247×10-4   cm for the sample with a thickness of 450 nm.

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APA: Copy

Azarvand Hassan Fard, Bahare, & Ebrahimi Ardei, Khadijeh. (2019). Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, 14(38 ), 43-51. SID. https://sid.ir/paper/399335/en

Vancouver: Copy

Azarvand Hassan Fard Bahare, Ebrahimi Ardei Khadijeh. Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum. IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING[Internet]. 2019;14(38 ):43-51. Available from: https://sid.ir/paper/399335/en

IEEE: Copy

Bahare Azarvand Hassan Fard, and Khadijeh Ebrahimi Ardei, “Effect of Concentration and Thickness of Aluminum Contamination on the Properties of Structural, Optical and Electrical of Tin Oxide (Sno2)Thin Films Doped With Aluminum,” IRANIAN JOURNAL OF SURFACE SCIENCE AND ENGINEERING, vol. 14, no. 38 , pp. 43–51, 2019, [Online]. Available: https://sid.ir/paper/399335/en

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