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Information Journal Paper

Title

SHORT REPORT: PREVALENCE OF ROOT ROT PATHOGENS AND YIELD LOSSES TO THE DISEASE ON COMMON BEAN IN ZANJAN, IRAN

Pages

  347-347

Keywords

Not Registered.

Abstract

 Root rots are important diseases in bean growing regions of the world including Iran. In 2007, prevalence of root rot pathogens and yield losses to the disease on common bean were studied under environmental conditions in Zanjan province. In general, the mean disease incidence (DI) and mean frequency of root rot pathogens isolated from root samples increased over the sampling time, from V3 to R9 growth stage, regardless of field location.Fusarium solani was the predominant fungus isolated from 54.2% of samples over the sampling time in 13 fields followed by Rhizoctonia solani (45.9%), Macrophomina phaseolina (26.5%) and F. oxysporum (9.4%). At the last sampling time, DI ranged from 4.7 to 95.3%, whereas the greatest mean values for disease index (DX) and severity (DS) were 29.2 and 2, respectively. Regression analyses demonstrated that each unites increase in DI, DS and DX reduced the number of pods by 0.1, 3.5 and 0.2, and seeds by 0.3, 12.4 and 0.7 per bean plant, respectively. Despite the weak correlation between DX and yield (g/m2), seed yield reduced by 5.8 (0.6%) and 275 (26.7%) g/m2 per DI and DS unite increase, respectively.Seed yield decreased by 30.5 (0.8%), 1241 (32.3%) and 68.7 (2%) no/m2 for each unite increase in DI, DS and DX, respectively. In general, yield loss averaged 10.8% pod no/plant and 12.1% seed no/plant or yield (no/m2) due to mean DX in the fields. DX was positively correlated with 100-seed weight irrespective of cultivar. Relations obtained between DX and yield components, particularly Pod no/Plant = 11.263 – 0.2021 DX and Yield (seed no/m2) = 3407 – 68.7 DX, may contribute to the future estimation of bean yield losses to root rots and selection for resistant cultivars.

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  • Cite

    APA: Copy

    NASERI, B., & MORADI, PARVIZ. (2007). SHORT REPORT: PREVALENCE OF ROOT ROT PATHOGENS AND YIELD LOSSES TO THE DISEASE ON COMMON BEAN IN ZANJAN, IRAN. IRANIAN JOURNAL OF PLANT PATHOLOGY, 43(3 (171)), 347-347. SID. https://sid.ir/paper/48348/en

    Vancouver: Copy

    NASERI B., MORADI PARVIZ. SHORT REPORT: PREVALENCE OF ROOT ROT PATHOGENS AND YIELD LOSSES TO THE DISEASE ON COMMON BEAN IN ZANJAN, IRAN. IRANIAN JOURNAL OF PLANT PATHOLOGY[Internet]. 2007;43(3 (171)):347-347. Available from: https://sid.ir/paper/48348/en

    IEEE: Copy

    B. NASERI, and PARVIZ MORADI, “SHORT REPORT: PREVALENCE OF ROOT ROT PATHOGENS AND YIELD LOSSES TO THE DISEASE ON COMMON BEAN IN ZANJAN, IRAN,” IRANIAN JOURNAL OF PLANT PATHOLOGY, vol. 43, no. 3 (171), pp. 347–347, 2007, [Online]. Available: https://sid.ir/paper/48348/en

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