Automatic under Voltage Load Shedding and Automatic Switching of Bus Reactors for Mitigating Fault Induced Delayed Voltage Recovery

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RASHIDI FARZAN; Feshki Farahani Hassan

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Journal Paper

Paper Information

Journal: ELECTRONIC INDUSTRIES Year:2017 | Volume:8 | Issue:2 Page(s): 171-177

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Information Journal Paper

Title

Automatic under Voltage Load Shedding and Automatic Switching of Bus Reactors for Mitigating Fault Induced Delayed Voltage Recovery

Author(s)

RASHIDI FARZAN | Feshki Farahani Hassan | Issue Writer Certificate

Keywords

Fault Induced Delayed Voltage Recovery

Air Conditioner

Induction Motor

Bus Reactor

Under Voltage Load Shedding

Abstract

This paper presents the application of automatic under voltage load tripping and switching of shunt reactors as counter measures for Fault Induced Delayed Voltage Recovery (FIDVR). As dynamic behavior of loads has significant impact on simulating FIDVR, proper load modeling is also discussed in this paper. Simulations conducted on actual network show that the proposed load model is effectively able to simulate FIDVR. It also shown that automatic Under Voltage Load Shedding and switching of shunt reactors can be used as counter measures for reducing risk of voltage collapse or over voltage conditions that may take place following load tripping caused by FIDVR.

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APA: Copy

RASHIDI, FARZAN, & Feshki Farahani, Hassan. (2017). Automatic under Voltage Load Shedding and Automatic Switching of Bus Reactors for Mitigating Fault Induced Delayed Voltage Recovery. ELECTRONIC INDUSTRIES, 8(2 ), 171-177. SID. https://sid.ir/paper/739544/en

Vancouver: Copy

RASHIDI FARZAN, Feshki Farahani Hassan. Automatic under Voltage Load Shedding and Automatic Switching of Bus Reactors for Mitigating Fault Induced Delayed Voltage Recovery. ELECTRONIC INDUSTRIES[Internet]. 2017;8(2 ):171-177. Available from: https://sid.ir/paper/739544/en

IEEE: Copy

FARZAN RASHIDI, and Hassan Feshki Farahani, “Automatic under Voltage Load Shedding and Automatic Switching of Bus Reactors for Mitigating Fault Induced Delayed Voltage Recovery,” ELECTRONIC INDUSTRIES, vol. 8, no. 2 , pp. 171–177, 2017, [Online]. Available: https://sid.ir/paper/739544/en

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