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Scientific Information Database

ISSN: 2588-4824

Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Issue Information

INTERNATIONAL SYMPOSIUM ON TEMPERATURE AND THERMAL MEASUREMENTS IN INDUSTRY AND SCIENCE
Year:2004 | Volume:- | Issue:9|Papers Count:1

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Title:

EMITTANCE STANDARDS FOR IMPROVED RADIATION THERMOMETRY DURING THERMAL PROCESSING OF SILICON MATERIALS

Author(s):

TSAI B.K. | DEWITT D.P. | EARLY E.A.

Journal:

INTERNATIONAL SYMPOSIUM ON TEMPERATURE AND THERMAL MEASUREMENTS IN INDUSTRY AND SCIENCE

Issue Info:

Year:
2004
Volume:
-
Issue:
9
Pages:
0-0

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Abstract:

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Scientific Information Database

ISSN: 2588-4824

Journal Issue Information

INTERNATIONAL SYMPOSIUM ON TEMPERATURE AND THERMAL MEASUREMENTS IN INDUSTRY AND SCIENCE Year:2004 | Volume:- | Issue:9|Papers Count:1

INTERNATIONAL SYMPOSIUM ON TEMPERATURE AND THERMAL MEASUREMENTS IN INDUSTRY AND SCIENCE
Year:2004 | Volume:- | Issue:9|Papers Count:1