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مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Issue Information

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Year:2000 | Volume:9 | Issue:1|Papers Count:1

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Year

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Journal Article

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فارسی Version

Title:

QUALITY FACTORS IN MICRON- AND SUBMICRON-THICK CANTILEVERS

Author(s):

YASUMURA K.Y. | STOWE T.D. | CHOW E.M.

Journal:

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS

Issue Info:

Year:
2000
Volume:
9
Issue:
1
Pages:
117-125

Keywords:

Abstract:

Yearly Impact: مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Scientific Information Database

ISSN: 2588-4824

Journal Issue Information

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS Year:2000 | Volume:9 | Issue:1|Papers Count:1

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Year:2000 | Volume:9 | Issue:1|Papers Count:1