Performance Analysis and Verification of Elastic Circuits under Process Variations

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

Zaeemi M.; Mohammadi S.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: International Journal of Engineering Year:2025 | Volume:38 | Issue:10 Page(s): 2273-2287

Download Full-Text

View:

Download:

Cites:

Information Journal Paper

Title

Performance Analysis and Verification of Elastic Circuits under Process Variations

Author(s)

Zaeemi M. | Mohammadi S. | Issue Writer Certificate

Keywords

Elastic Circuits

Early evaluation

High-level modeling

performance analysis

Process Variation

Abstract

The diversity of designs and optimization methods for elastic systems makes evaluating their performance challenging. This paper proposes a method based on xMAS and High-level modeling to analyze the performance, functional and timing verification of regular and Early evaluation synchronous Elastic Circuits while considering Process Variations. The xMAS framework provides modularity, precise semantics, and executable models, enhancing formal verification and high-level analysis capabilities over existing approaches. The proposed platform calculates the throughput value, which is the most critical performance factor in Elastic Circuits. The power, delay, and PDP of all Early evaluation elastic components are evaluated under Process Variations and compared to those of regular Elastic Circuits. The results indicate that Early evaluation properties increase the sensitivity of circuit components to Process Variations, making their performance less predictable. Modeling results of the Elastic DLX microprocessor highlight these findings by demonstrating that Process Variations can cause a 26% reduction in throughput and lead to a 0. 2% chance of synchronization errors between data and control signals. These findings underscore the critical need to account for Process Variations when designing and verifying Early evaluation Elastic Circuits to maintain performance reliability.

Multimedia

No record.

Cites

No record.

References

No record.

Cite

Related Journal Papers

No record.

Related Seminar Papers

No record.

Related Plans