ANISOTROPIC PEAK BROADENING ANALYSIS OF SRS DIFFRACTION FROM TWIN MICROSTRUCTURS IN 
YBCOX SAMPLE

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KHOUSHNEVISAN B.; MOHAMMADI MAHNAZ

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Journal: Iranian Journal of Physics Research Year:2010 | Volume:10 | Issue:2 Page(s): 131-134

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Information Journal Paper

Title

ANISOTROPIC PEAK BROADENING ANALYSIS OF SRS DIFFRACTION FROM TWIN MICROSTRUCTURS IN YBCOX SAMPLE

Author(s)

KHOUSHNEVISAN B. | MOHAMMADI MAHNAZ | Issue Writer Certificate

Keywords

TWIN AREAQ3

RIETVELD REFINEMENTQ3

Abstract

Reitveld full profile refinement analysis has been done on Synchrotron diffraction data from a powder sample of YBCOx at RT and 500oC. Anisotropic peak broadening for (h00) and (hh0) lines has been observed by Williamson-Hall (W-H) analysis and that is in agreement with formation of twin's microstructures along (110) crystal planes in the sample. In addition, size and strain of the crystallites has been inferred in our study also.

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APA: Copy

KHOUSHNEVISAN, B., & MOHAMMADI, MAHNAZ. (2010). ANISOTROPIC PEAK BROADENING ANALYSIS OF SRS DIFFRACTION FROM TWIN MICROSTRUCTURS IN YBCO_X SAMPLE. IRANIAN JOURNAL OF PHYSICS RESEARCH, 10(2), 131-134. SID. https://sid.ir/paper/1899/en

Vancouver: Copy

KHOUSHNEVISAN B., MOHAMMADI MAHNAZ. ANISOTROPIC PEAK BROADENING ANALYSIS OF SRS DIFFRACTION FROM TWIN MICROSTRUCTURS IN YBCO_X SAMPLE. IRANIAN JOURNAL OF PHYSICS RESEARCH[Internet]. 2010;10(2):131-134. Available from: https://sid.ir/paper/1899/en

IEEE: Copy

B. KHOUSHNEVISAN, and MAHNAZ MOHAMMADI, “ANISOTROPIC PEAK BROADENING ANALYSIS OF SRS DIFFRACTION FROM TWIN MICROSTRUCTURS IN YBCO_X SAMPLE,” IRANIAN JOURNAL OF PHYSICS RESEARCH, vol. 10, no. 2, pp. 131–134, 2010, [Online]. Available: https://sid.ir/paper/1899/en

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