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Information Journal Paper

Title

Simulation of OLED And Its Performance Improvement by Electron Injection Layer Modification

Pages

  123-131

Abstract

 Study of electron injection materials is one of the most important steps in obtaining high efficient and low driving voltage in organic light – emitting diodes (OLEDs). In this article, we simulated OLED devices with structure of ITO/PEDOT: PSS/PH-PPV/EIL/Al in Atlas Silvaco in which, NaSt, Al2O3 and TiO2 are used as Electron Injection Layer (EIL). The OLED with Al2O3 exhibited higher current density, higher luminance (13550 cd/m2), lower driving voltage (2. 3V) and lower operating voltage (4. 05V) compared to the two other structures. The reason is greater electric field (about 2. 4 times greater than that of two other structures) due to much more difference between work function of the device with Al2O3 and electron affinity of PH-PPV, causing improvement of charge carrier injection. Furthermore, recombination almost occurs in the middle of the light emission layer. However, the OLED that employs TiO2 as Electron Injection Layer, showed the highest external Efficiency due to increase in radiation recombination rate in comparison with other recombination mechanisms in the light emission layer.

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    APA: Copy

    Bagheri, Marjan, Arabpour, Farzaneh, & Banihashemi, seyed Mehdi. (2020). Simulation of OLED And Its Performance Improvement by Electron Injection Layer Modification. ELECTRONIC INDUSTRIES, 11(1 ), 123-131. SID. https://sid.ir/paper/229567/en

    Vancouver: Copy

    Bagheri Marjan, Arabpour Farzaneh, Banihashemi seyed Mehdi. Simulation of OLED And Its Performance Improvement by Electron Injection Layer Modification. ELECTRONIC INDUSTRIES[Internet]. 2020;11(1 ):123-131. Available from: https://sid.ir/paper/229567/en

    IEEE: Copy

    Marjan Bagheri, Farzaneh Arabpour, and seyed Mehdi Banihashemi, “Simulation of OLED And Its Performance Improvement by Electron Injection Layer Modification,” ELECTRONIC INDUSTRIES, vol. 11, no. 1 , pp. 123–131, 2020, [Online]. Available: https://sid.ir/paper/229567/en

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