OPTICAL PROPERTIES OF SILICON NANO LAYERS BY USING KRAMERS- KRONIG METHOD

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

KANGARLOU H.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS Year:2014 | Volume:6 | Issue:1 Page(s): 79-84

Download Full-Text

Persian Verion

View:

681

Download:

171

Cites:

Information Journal Paper

Title

OPTICAL PROPERTIES OF SILICON NANO LAYERS BY USING KRAMERS- KRONIG METHOD

Author(s)

KANGARLOU H. | Issue Writer Certificate

Keywords

SILICONQ2

OPTICAL PROPERTIESQ2

KRAMERS-KRONIG RELATIONSQ2

THIN FILMSQ2

Abstract

SILICON thin layers are deposited on glass substrates with the thickness of 103 nm, 147 nm and 197 nm. The layers are produced with electron gun evaporation method under ultra-high vacuum condition. The optical Reflectance and the Transmittance of produced layers were measured by using spectrophotometer. The optical functions such as, real and imaginary part of refractive index, real and imaginary part of dielectric constant, real and imaginary part of conductivity, absorption coefficient and optical band gap energy are calculated basing on the KRAMERS-KRONIG RELATIONS. The void fractions of the SILICON films are calculated by using Aspnes theorem. The effect of layer thickness on OPTICAL PROPERTIES of SILICON THIN FILMS is investigated.

Cites

No record.

References

Cite

APA: Copy

KANGARLOU, H.. (2014). OPTICAL PROPERTIES OF SILICON NANO LAYERS BY USING KRAMERS- KRONIG METHOD. INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS, 6(1), 79-84. SID. https://sid.ir/paper/231655/en

Vancouver: Copy

KANGARLOU H.. OPTICAL PROPERTIES OF SILICON NANO LAYERS BY USING KRAMERS- KRONIG METHOD. INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS[Internet]. 2014;6(1):79-84. Available from: https://sid.ir/paper/231655/en

IEEE: Copy

H. KANGARLOU, “OPTICAL PROPERTIES OF SILICON NANO LAYERS BY USING KRAMERS- KRONIG METHOD,” INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS, vol. 6, no. 1, pp. 79–84, 2014, [Online]. Available: https://sid.ir/paper/231655/en

Related Journal Papers