FAILURE MODE AND EFFECTS ANALYSIS USING DATA ENVELOPMENT ANALYSIS

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

HADI VENCHEH A.; HEJAZI S.; FORGHANI A.; HEJAZI S.N.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS Year:2012 | Volume:4 | Issue:3 Page(s): 197-211

Download Full-Text

Persian Verion

View:

73,558

Download:

202

Cites:

Information Journal Paper

Title

FAILURE MODE AND EFFECTS ANALYSIS USING DATA ENVELOPMENT ANALYSIS

Author(s)

HADI VENCHEH A. | HEJAZI S. | FORGHANI A. | HEJAZI S.N. | Issue Writer Certificate

Keywords

FAILURE MODE AND EFFECT ANALYSIS (FMEA)Q2

DATA ENVELOPMENT ANALYSIS (DEA)Q2

RISK PRIORITY NUMBERQ2

Abstract

In this paper, we propose a bounded DEA based model to measure the overall risk of failure modes. In the proposed model risk is measured within the range of an interval, whose performance is definitely superior to any one. The risks, obtained from bounded DEA models, turn out to be all intervals and are referred to as interval risk, which combine the best and the worst relative risk in a reasonable manner to give an overall assessment of performances for all failure modes. Assessor’s preference information on input and output weights is also incorporated into bounded DEA models reasonably and conveniently. A practical example is provided to compare the proposed model with those in the literature.

Cites

No record.

References

Cite

APA: Copy

HADI VENCHEH, A., HEJAZI, S., FORGHANI, A., & HEJAZI, S.N.. (2012). FAILURE MODE AND EFFECTS ANALYSIS USING DATA ENVELOPMENT ANALYSIS. INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS, 4(3), 197-211. SID. https://sid.ir/paper/231786/en

Vancouver: Copy

HADI VENCHEH A., HEJAZI S., FORGHANI A., HEJAZI S.N.. FAILURE MODE AND EFFECTS ANALYSIS USING DATA ENVELOPMENT ANALYSIS. INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS[Internet]. 2012;4(3):197-211. Available from: https://sid.ir/paper/231786/en

IEEE: Copy

A. HADI VENCHEH, S. HEJAZI, A. FORGHANI, and S.N. HEJAZI, “FAILURE MODE AND EFFECTS ANALYSIS USING DATA ENVELOPMENT ANALYSIS,” INTERNATIONAL JOURNAL OF INDUSTRIAL MATHEMATICS, vol. 4, no. 3, pp. 197–211, 2012, [Online]. Available: https://sid.ir/paper/231786/en

Related Journal Papers