Fe/Al/Fe tritilayers; Thin film; High Temperature in X-Ray Diffraction (HT-XRD)

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Nezamdost Seyed Jafar

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Journal Paper

Paper Information

Journal: Nashrieh Shimi va Mohandesi Shimi Iran Year:2019 | Volume:37 | Issue:4 (90) Page(s): 1-9

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Information Journal Paper

Title

Fe/Al/Fe tritilayers; Thin film; High Temperature in X-Ray Diffraction (HT-XRD)

Author(s)

Nezamdost Seyed Jafar | Issue Writer Certificate

Keywords

Fe/Al/Fe tritilayers;Thin film;XQ1

ray diffraction in high temperature (HTQ1

XRD)Q1

Abstract

IIn this paper, the results of the structure and magnetic properties of Fe/Al/Fe multilayers were prepared on monocrystalline Si were investigated. Thin films were obtained by RF Magnetron Sputtering Method (RF-MSM). The results of XRD analysis show that the preferred direction of Fe/Al/Fe multilayers is oriented (200). Then, the thermal behavior of samples in high temperatures in vacuum was studied using HT – XRD analysis between 26° C-800° C at 180min. Finally, the morphology of surface, gin sized and magnetic properties were studied using AFM, MFM, and AGFM analysis, respectively.

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APA: Copy

Nezamdost, Seyed Jafar. (2019). Fe/Al/Fe tritilayers; Thin film; High Temperature in X-Ray Diffraction (HT-XRD). NASHRIEH SHIMI VA MOHANDESI SHIMI IRAN (PERSIAN), 37(4 (90) ), 1-9. SID. https://sid.ir/paper/26047/en

Vancouver: Copy

Nezamdost Seyed Jafar. Fe/Al/Fe tritilayers; Thin film; High Temperature in X-Ray Diffraction (HT-XRD). NASHRIEH SHIMI VA MOHANDESI SHIMI IRAN (PERSIAN)[Internet]. 2019;37(4 (90) ):1-9. Available from: https://sid.ir/paper/26047/en

IEEE: Copy

Seyed Jafar Nezamdost, “Fe/Al/Fe tritilayers; Thin film; High Temperature in X-Ray Diffraction (HT-XRD),” NASHRIEH SHIMI VA MOHANDESI SHIMI IRAN (PERSIAN), vol. 37, no. 4 (90) , pp. 1–9, 2019, [Online]. Available: https://sid.ir/paper/26047/en

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