STUDY OF THICKNESS DEPENDENT CHARACTERICTICS OF CU2STHIN FILM FOR VARIOUS APPLICATIONS

Q: How can I download an article?

To download an article from SID, first log in to the site, search for the article title, and click on the 'Download Article' option.

Q: How can I download an ISI article?

To download an ISI article on SID, enter the keyword or article title in the search bar, view the relevant results, click on the desired article, and select the 'Download Article' option.

Q: How can I access the SID database?

To access the SID database, visit SID.ir, create an account, and log in to access scientific resources.

Q: Is downloading articles from SID free?

Some articles on SID are available for free, while others require payment. Details are specified on the article's page.

RAMYA M.; GANESAN S.

مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

Journal Paper

Paper Information

Journal: Iranian Journal of Materials Science and Engineering Year:2011 | Volume:8 | Issue:2 Page(s): 34-40

Download Full-Text

View:

276

Download:

Cites:

Information Journal Paper

Title

STUDY OF THICKNESS DEPENDENT CHARACTERICTICS OF CU2STHIN FILM FOR VARIOUS APPLICATIONS

Author(s)

RAMYA M. | GANESAN S. | Issue Writer Certificate

Keywords

THIN FILM

CU2S

VACUUM EVAPORATION

RESISTIVITY

STRUCTURAL PROPERTY

Abstract

Different thickness of Cu2S THIN FILMs were prepared by VACUUM EVAPORATION under a pressure of 10-6 torr at an evaporation rate of 3A/sec. Cu2S has direct band gap energy and indirect band gap energy at 1.2 eV and 1.8 eV respectively. This paper presents the analysis of structural and optical properties of the Cu2S THIN FILM by X-ray diffractometer (XRD) and UV-Vis-NIR Spectrophotometer. XRD studies showed ploycrystallinity of CuXS THIN FILMs at higher thickness. Optical spectra of Cu2S film exhibit high transmittance in the visible region and high absorbance in the near infra-red region. Moreover, the optical property of the film confirms that transmission mainly depends on the thickness of the film. Structural and RESISTIVITY property reveals that Cu2S film at higher thicknesses shows slight deviations in stoichiometry. Possible applications of the Cu2S THIN FILMs are also discussed.

Cites

INFLUENCE OF THICKNESS AND TEMPERATURE ON THE PROPERTIES OF CU2S THIN FILMS

References

No record.

Cite

APA: Copy

RAMYA, M., & GANESAN, S.. (2011). STUDY OF THICKNESS DEPENDENT CHARACTERICTICS OF CU₂STHIN FILM FOR VARIOUS APPLICATIONS. IRANIAN JOURNAL OF MATERIALS SCIENCE AND ENGINEERING, 8(2), 34-40. SID. https://sid.ir/paper/276778/en

Vancouver: Copy

RAMYA M., GANESAN S.. STUDY OF THICKNESS DEPENDENT CHARACTERICTICS OF CU₂STHIN FILM FOR VARIOUS APPLICATIONS. IRANIAN JOURNAL OF MATERIALS SCIENCE AND ENGINEERING[Internet]. 2011;8(2):34-40. Available from: https://sid.ir/paper/276778/en

IEEE: Copy

M. RAMYA, and S. GANESAN, “STUDY OF THICKNESS DEPENDENT CHARACTERICTICS OF CU₂STHIN FILM FOR VARIOUS APPLICATIONS,” IRANIAN JOURNAL OF MATERIALS SCIENCE AND ENGINEERING, vol. 8, no. 2, pp. 34–40, 2011, [Online]. Available: https://sid.ir/paper/276778/en

Related Journal Papers

No record.

Related Seminar Papers

No record.

Related Plans

No record.

Recommended Workshops