Information Journal Paper
APA:
CopyKAPOOR, K., LAHIRI, D., & BATRA, I.S.. (2005). X-RAY DIFFRACTION LINE PROFILE ANALYSIS FOR DEFECT STUDY IN CU-1 WT.% CR-0.1 WT.% ZR ALLOY. MATERIALS CHARACTERIZATION, 54(2), 131-140. SID. https://sid.ir/paper/596505/en
Vancouver:
CopyKAPOOR K., LAHIRI D., BATRA I.S.. X-RAY DIFFRACTION LINE PROFILE ANALYSIS FOR DEFECT STUDY IN CU-1 WT.% CR-0.1 WT.% ZR ALLOY. MATERIALS CHARACTERIZATION[Internet]. 2005;54(2):131-140. Available from: https://sid.ir/paper/596505/en
IEEE:
CopyK. KAPOOR, D. LAHIRI, and I.S. BATRA, “X-RAY DIFFRACTION LINE PROFILE ANALYSIS FOR DEFECT STUDY IN CU-1 WT.% CR-0.1 WT.% ZR ALLOY,” MATERIALS CHARACTERIZATION, vol. 54, no. 2, pp. 131–140, 2005, [Online]. Available: https://sid.ir/paper/596505/en