THE RELIABILITY OF MICROELECTROMECHANICAL SYSTEMS (MEMS) IN SHOCK ENVIRONMENTS

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SRIKAR V.T.; SENTURIA S.D.

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Journal Paper

Paper Information

Journal: JOURNAL OF MICROELECTROMECHANICAL SYSTEMS Year:2002 | Volume:11 | Issue:3 Page(s): 206-214

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Information Journal Paper

Title

THE RELIABILITY OF MICROELECTROMECHANICAL SYSTEMS (MEMS) IN SHOCK ENVIRONMENTS

Author(s)

SRIKAR V.T. | SENTURIA S.D. | Issue Writer Certificate

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Abstract

Cites

MECHANICAL BEHAVIOR OF AN ELECTROSTATICALLY-ACTUATED MICROBEAM UNDER MECHANICAL SHOCK

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APA: Copy

SRIKAR, V.T., & SENTURIA, S.D.. (2002). THE RELIABILITY OF MICROELECTROMECHANICAL SYSTEMS (MEMS) IN SHOCK ENVIRONMENTS. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 11(3), 206-214. SID. https://sid.ir/paper/601697/en

Vancouver: Copy

SRIKAR V.T., SENTURIA S.D.. THE RELIABILITY OF MICROELECTROMECHANICAL SYSTEMS (MEMS) IN SHOCK ENVIRONMENTS. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS[Internet]. 2002;11(3):206-214. Available from: https://sid.ir/paper/601697/en

IEEE: Copy

V.T. SRIKAR, and S.D. SENTURIA, “THE RELIABILITY OF MICROELECTROMECHANICAL SYSTEMS (MEMS) IN SHOCK ENVIRONMENTS,” JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, vol. 11, no. 3, pp. 206–214, 2002, [Online]. Available: https://sid.ir/paper/601697/en

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