Information Journal Paper
APA:
CopyTANNER, D.M., WALRAVEN, J.A., & HELGESEN, K.. (2000). MEMS RELIABILITY IN SHOCK ENVIRONMENTS. PROCEEDINGS OF IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, -(-), 129-138. SID. https://sid.ir/paper/603718/en
Vancouver:
CopyTANNER D.M., WALRAVEN J.A., HELGESEN K.. MEMS RELIABILITY IN SHOCK ENVIRONMENTS. PROCEEDINGS OF IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM[Internet]. 2000;-(-):129-138. Available from: https://sid.ir/paper/603718/en
IEEE:
CopyD.M. TANNER, J.A. WALRAVEN, and K. HELGESEN, “MEMS RELIABILITY IN SHOCK ENVIRONMENTS,” PROCEEDINGS OF IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, vol. -, no. -, pp. 129–138, 2000, [Online]. Available: https://sid.ir/paper/603718/en