Information Journal Paper
APA:
CopyMIURA, K., & LIN, S.Y.. (2002). MAPPING QUANTITATIVE TRAIT LOCI CONTROLLING SEED LONGEVITY IN RICE (ORYZA SATIVA L.). THEORETICAL AND APPLIED GENETICS, 104(-), 981-986. SID. https://sid.ir/paper/608726/en
Vancouver:
CopyMIURA K., LIN S.Y.. MAPPING QUANTITATIVE TRAIT LOCI CONTROLLING SEED LONGEVITY IN RICE (ORYZA SATIVA L.). THEORETICAL AND APPLIED GENETICS[Internet]. 2002;104(-):981-986. Available from: https://sid.ir/paper/608726/en
IEEE:
CopyK. MIURA, and S.Y. LIN, “MAPPING QUANTITATIVE TRAIT LOCI CONTROLLING SEED LONGEVITY IN RICE (ORYZA SATIVA L.),” THEORETICAL AND APPLIED GENETICS, vol. 104, no. -, pp. 981–986, 2002, [Online]. Available: https://sid.ir/paper/608726/en