مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources

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Information Journal Paper

Title

ANALYSIS OF GRADIENTS OF MECHANICAL STRESSES BY X-RAY DIFFRACTION MEASUREMENTS AT FIXED PENETRATION/INFORMATION DEPTHS

Pages

  633-646

Keywords

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Abstract

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  • Cite

    APA: Copy

    KUMAR, A., WEIZEL, U., & MITTEMEIJER, E.J.. (2006). ANALYSIS OF GRADIENTS OF MECHANICAL STRESSES BY X-RAY DIFFRACTION MEASUREMENTS AT FIXED PENETRATION/INFORMATION DEPTHS. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 39(-), 633-646. SID. https://sid.ir/paper/619506/en

    Vancouver: Copy

    KUMAR A., WEIZEL U., MITTEMEIJER E.J.. ANALYSIS OF GRADIENTS OF MECHANICAL STRESSES BY X-RAY DIFFRACTION MEASUREMENTS AT FIXED PENETRATION/INFORMATION DEPTHS. JOURNAL OF APPLIED CRYSTALLOGRAPHY[Internet]. 2006;39(-):633-646. Available from: https://sid.ir/paper/619506/en

    IEEE: Copy

    A. KUMAR, U. WEIZEL, and E.J. MITTEMEIJER, “ANALYSIS OF GRADIENTS OF MECHANICAL STRESSES BY X-RAY DIFFRACTION MEASUREMENTS AT FIXED PENETRATION/INFORMATION DEPTHS,” JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 39, no. -, pp. 633–646, 2006, [Online]. Available: https://sid.ir/paper/619506/en

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    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
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