Information Journal Paper
APA:
CopyYU, L., & GIURGIUTIU, V.. (2005). ADVANCED SIGNAL PROCESSING FOR ENHANCED DAMAGE DETECTION WITH PIEZOELECTRIC WAFER ACTIVE SENSORS. SMART STRUCTURES AND SYSTEMS, 1(2), 185-215. SID. https://sid.ir/paper/622818/en
Vancouver:
CopyYU L., GIURGIUTIU V.. ADVANCED SIGNAL PROCESSING FOR ENHANCED DAMAGE DETECTION WITH PIEZOELECTRIC WAFER ACTIVE SENSORS. SMART STRUCTURES AND SYSTEMS[Internet]. 2005;1(2):185-215. Available from: https://sid.ir/paper/622818/en
IEEE:
CopyL. YU, and V. GIURGIUTIU, “ADVANCED SIGNAL PROCESSING FOR ENHANCED DAMAGE DETECTION WITH PIEZOELECTRIC WAFER ACTIVE SENSORS,” SMART STRUCTURES AND SYSTEMS, vol. 1, no. 2, pp. 185–215, 2005, [Online]. Available: https://sid.ir/paper/622818/en