Information Journal Paper
APA:
CopyLIU, YI, & ZHENG, YUAN F.. (2005). ONE-AGAINST-ALL MULTI-CLASS SVM CLASSIFICATION USING RELIABILITY MEASURES. IEEE CONFERENCES INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS, -(-), 0-0. SID. https://sid.ir/paper/623054/en
Vancouver:
CopyLIU YI, ZHENG YUAN F.. ONE-AGAINST-ALL MULTI-CLASS SVM CLASSIFICATION USING RELIABILITY MEASURES. IEEE CONFERENCES INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS[Internet]. 2005;-(-):0-0. Available from: https://sid.ir/paper/623054/en
IEEE:
CopyYI LIU, and YUAN F. ZHENG, “ONE-AGAINST-ALL MULTI-CLASS SVM CLASSIFICATION USING RELIABILITY MEASURES,” IEEE CONFERENCES INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS, vol. -, no. -, pp. 0–0, 2005, [Online]. Available: https://sid.ir/paper/623054/en