Information Journal Paper
APA:
CopyMADHUP, D.K., SUBEDI, D.P., & CHIMOURIY, S.P.. (2010). OPTICAL CHARACTERIZATION AND THICKNESS ESTIMATION OF AL3+ ION DOPED ZNO NANO-FILMS FROM TRANSMITTANCE SPECTRA. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 12(-), 1035-1044. SID. https://sid.ir/paper/624402/en
Vancouver:
CopyMADHUP D.K., SUBEDI D.P., CHIMOURIY S.P.. OPTICAL CHARACTERIZATION AND THICKNESS ESTIMATION OF AL3+ ION DOPED ZNO NANO-FILMS FROM TRANSMITTANCE SPECTRA. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS[Internet]. 2010;12(-):1035-1044. Available from: https://sid.ir/paper/624402/en
IEEE:
CopyD.K. MADHUP, D.P. SUBEDI, and S.P. CHIMOURIY, “OPTICAL CHARACTERIZATION AND THICKNESS ESTIMATION OF AL3+ ION DOPED ZNO NANO-FILMS FROM TRANSMITTANCE SPECTRA,” JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol. 12, no. -, pp. 1035–1044, 2010, [Online]. Available: https://sid.ir/paper/624402/en