Information Journal Paper
APA:
CopyTSAI, D.M., & LUO, J.U.. (2011). MEAN SHIFT-BASED DEFECT DETECTION IN MULTICRYSTALLINE SOLAR WAFER SURFACES. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 7(-), 125-135. SID. https://sid.ir/paper/679292/en
Vancouver:
CopyTSAI D.M., LUO J.U.. MEAN SHIFT-BASED DEFECT DETECTION IN MULTICRYSTALLINE SOLAR WAFER SURFACES. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS[Internet]. 2011;7(-):125-135. Available from: https://sid.ir/paper/679292/en
IEEE:
CopyD.M. TSAI, and J.U. LUO, “MEAN SHIFT-BASED DEFECT DETECTION IN MULTICRYSTALLINE SOLAR WAFER SURFACES,” IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, vol. 7, no. -, pp. 125–135, 2011, [Online]. Available: https://sid.ir/paper/679292/en