Information Journal Paper
APA:
Copy. (2017). A predictive tunnel FET compact model with atomistic simulation validation. IEEE TRANSACTIONS ON ELECTRON DEVICES, 64(-), 599-605. SID. https://sid.ir/paper/728840/en
Vancouver:
Copy. A predictive tunnel FET compact model with atomistic simulation validation. IEEE TRANSACTIONS ON ELECTRON DEVICES[Internet]. 2017;64(-):599-605. Available from: https://sid.ir/paper/728840/en
IEEE:
Copy, “A predictive tunnel FET compact model with atomistic simulation validation,” IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 64, no. -, pp. 599–605, 2017, [Online]. Available: https://sid.ir/paper/728840/en