RF Source Localization Using Obstacles Map and Reflections

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Haidari Saeid; MORADI HADI; Dehghan Seyyed M.M.

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Journal Paper

Paper Information

Journal: International Journal of Industrial Electronics, Control and Optimization Year:2021 | Volume:4 | Issue:2 Page(s): 181-190

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Information Journal Paper

Title

RF Source Localization Using Obstacles Map and Reflections

Author(s)

Haidari Saeid | MORADI HADI | Dehghan Seyyed M.M. | Issue Writer Certificate

Keywords

Obstacle Map

Particle filter

Reflection

RF source Localization

RSSI

UAV

Abstract

This paper proposes radio frequency (RF) source localization in a non-line of sight condition using the map of obstacles. Received signal strength indicator (RSSI) and angle of arrival (AOA) measurements are observations obtained from the signal received on the unmanned aerial vehicles (UAV). In the proposed approach, AOA is used to determine the obstacle on the map from which the Reflection has happened. Then, RSSI information is used to determine the location of the RF source. In the basic version of the approach, the RF source is located by triangulation. In the advanced approach, the Reflection angle is also estimated to improve the localization accuracy. The estimation is done using the Particle filter approach. In addition, it is shown analytically that the maximum localization error for the advanced approach is bounded, but the relative formation of the reflectors with respect to each other can increase the localization error for the basic approach.

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APA: Copy

Haidari, Saeid, MORADI, HADI, & Dehghan, Seyyed M.M.. (2021). RF Source Localization Using Obstacles Map and Reflections. INTERNATIONAL JOURNAL OF INDUSTRIAL ELECTRONICS, CONTROL AND OPTIMIZATION, 4(2), 181-190. SID. https://sid.ir/paper/783487/en

Vancouver: Copy

Haidari Saeid, MORADI HADI, Dehghan Seyyed M.M.. RF Source Localization Using Obstacles Map and Reflections. INTERNATIONAL JOURNAL OF INDUSTRIAL ELECTRONICS, CONTROL AND OPTIMIZATION[Internet]. 2021;4(2):181-190. Available from: https://sid.ir/paper/783487/en

IEEE: Copy

Saeid Haidari, HADI MORADI, and Seyyed M.M. Dehghan, “RF Source Localization Using Obstacles Map and Reflections,” INTERNATIONAL JOURNAL OF INDUSTRIAL ELECTRONICS, CONTROL AND OPTIMIZATION, vol. 4, no. 2, pp. 181–190, 2021, [Online]. Available: https://sid.ir/paper/783487/en

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