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Information Seminar Paper

Title

ABSORBANCE MEASUREMENT OF FREE STANDING POROUS SILICON

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Abstract

 POROUS SILICON ARE PREPARED FROM P-TYPE SI WAFER BY ELECTROCHEMICAL METHOD WITH ETCHING TIMES OF 10, 20, 30, 40 MIN. SEM TOP AND CROSS SECTION VIEWS ARE MEASURED AND SHOWED THAT WITH INCREASING ETCHING TIME, THICKNESS OF POROUS LAYER AND POROSITY INCREASES. ALSO, ABSORBANCE OF SAMPLES IS DECREASED WITH INCREASING ETCHING TIME.

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    APA: Copy

    ZAFARI, RAZIEH, & SABET DARIANI, REZA. (2012). ABSORBANCE MEASUREMENT OF FREE STANDING POROUS SILICON. NATIONAL VACUUM CONFERENCE IRAN. SID. https://sid.ir/paper/906979/en

    Vancouver: Copy

    ZAFARI RAZIEH, SABET DARIANI REZA. ABSORBANCE MEASUREMENT OF FREE STANDING POROUS SILICON. 2012. Available from: https://sid.ir/paper/906979/en

    IEEE: Copy

    RAZIEH ZAFARI, and REZA SABET DARIANI, “ABSORBANCE MEASUREMENT OF FREE STANDING POROUS SILICON,” presented at the NATIONAL VACUUM CONFERENCE IRAN. 2012, [Online]. Available: https://sid.ir/paper/906979/en

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    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
    مرکز اطلاعات علمی Scientific Information Database (SID) - Trusted Source for Research and Academic Resources
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